![](/images/2016/03/24/5824_r.jpg)
Winbond SpiStack memories
Winbond Electronics has announced an expansion of its flash product portfolio with the introduction...
Photo: Company
![](/images/2013/07/19/5529_r.jpg)
Micron 16nm flash die
Micron Technology has announced the sampling of its 16nm, 128Gb MLC NAND flash memory devices,...
Photo: Company
![](/images/2013/07/15/5519_r.jpg)
KLA-Tencor 2910 series optical inspection system and eDR-7100 e-beam review tool
KLA-Tencor has announced the new 2910 series optical wafer defect inspection platform with...
Photo: Company
![](/images/2011/07/15/4913_r.jpg)
KLA-Tencor Surfscan SP3
KLA-Tencor has announced a new generation in the Surfscan family of wafer defect and surface...
Photo: Company
![](/images/2010/09/02/4629_r.jpg)
Canon 202x205mm image sensor
Canon has developed what it claims is the world's largest CMOS image sensor, with a chip...
Photo: Company
![](/images/2010/08/31/4627_r.jpg)
KLA-Tencor VisEdge CV300R-EP
KLA-Tencor has announced the latest addition to its VisEdge family of wafer edge inspection...
Photo: Company
![](/images/2010/06/28/4581_r.jpg)
Altatech AltaSight SL300 inspection system
Altatech Semiconductor has announced silicon wafer maker Siltronic is evaluating its AltaSight...
Photo: Company
![](/images/2009/12/02/4274_r.jpg)
KLA-Tencor ICOS WI-2250
KLA-Tencor has introduced its ICOS WI-2250 wafer inspector for MEMs and LED manufacturing...
Photo: Company
![](/images/2009/09/24/4143_r.jpg)
IDF San Francisco: Intel CEO displayed a silicon wafer built on 22nm process
Intel president and CEO Paul Otellini has displayed a silicon wafer containing its first...
Photo: Monica Chen