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STAr Technologies announces PoWoS trademark registration

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STAr Technologies, a leading semiconductor test probe card manufacturer, is pleased to announce that its trademark application for "PoWoS," Probe-on-Wafer-on-Substrate, has been approved by Taiwan Intellectual Property Office (TIPO), and the registration process is completed. The trademark covers the following product and service category: "Probe, test probe card, IC tester, mixed IC tester, IC tester manufacture/service, development of test software, and test consultant services, etc."

The PoWoS is technology based on multiple pending patents on probe cards, interfaces and tests, that incorporate wafer-level tests of advanced nanometer technology nodes semiconductor ICs. Probe cards are complex system that incorporates many advanced parts that is critical in semiconductor wafer-level tests process required to ensure high stability to achieve accurate test results and with extended lifetime to reduce COT (cost-of-test). STAr Technologies focuses on the interface and assembly technologies which efficiently enhances probe card performances and lower cost-of-ownership. The approval of PoWoS trademark provides essential layer of protection for the future technology developments and applications of STAr's probe cards.

STAr Technologies' trademark of

STAr Technologies' trademark of "PoWoS" (Probe-on-Wafer-on-Substrate)

"We are pleased that the Intellectual Property Office has approved our registration application and believe our probe card solution are ideal for industry customers. STAr has placed a value on the intellectual property and been underling the corporate commitment to protect its innovation and technology for future growth," said Dr. Choon-Leong LOU, CEO&CTO of STAr Technologies, Inc.