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Tuesday 7 May 2024
STAr Technologies and EDA Industries announce strategic partnership
STAr Technologies, Inc. (STAr) and EDA Industries (EDA) are pleased to announce a mutually strategic business expansion partnership. Combining product scopes and sales networks, this...
Wednesday 21 June 2023
STAr Technologies and Korea Conformity Laboratories sign MoU for semiconductor reliability test
STAr Technologies, Inc. ("STAr" for short), a well-known semiconductor test solutions supplier, and Korea Conformity Laboratories ("KCL" for short), a leading testing and certification...
Wednesday 14 June 2023
STAr Technologies opens Phoenix AZ probe card application service center
STAr Technologies, a leading test system and probe card supplier to semiconductor industry, today announced the opening of a new probe card demo and potential test services center...
Tuesday 11 April 2023
STAr Technologies unveils 3D/2.5D MEMS micro-cantilever WAT probe card
STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima...
Tuesday 27 December 2022
STAr Technologies announces PoWoS trademark registration
STAr Technologies, a leading semiconductor test probe card manufacturer, is pleased to announce that its trademark application for "PoWoS," Probe-on-Wafer-on-Substrate, has been approved...
Tuesday 26 July 2022
STAr Technologies releases new test software for advanced wafer-level reliability qualification
STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR...
Wednesday 13 July 2022
STAr Technologies announces sale of Accel-RF HTOL Burn-In systems to top Taiwan semiconductor foundries
STAr Technologies, a leading supplier of semiconductor reliability test systems, today announces the sale of Accel-RF HTOL Burn-In test systems to top semiconductor foundries in Taiwan...
Thursday 19 May 2022
STAr Technologies unveils one-touch memory test probe card
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet...
Thursday 24 March 2022
STAr Technologies completes order for all-in-one dynamic high current & voltage reliability test system
STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark...
Wednesday 2 June 2021
STAr Technologies delivers world first fine-pitch high-current MEMS vertical probe card for high-volume manufacturing
STAr Technologies, a leading supplier of semiconductor test systems and probe cards, announces the immediate availability of the Aries-Optima MEMS probe card, the world's first fine-pitch...
Friday 25 September 2020
STAr Technologies launches next generation all-in-one per-pin SMU reliability test system
STAr Technologies, a leader in parametric and reliability test systems today has launched STAr Pluto series tester to meet test needs for both Package- and Wafer-level reliability...
Monday 31 August 2020
STAr Technologies celebrates 20th anniversary
STAr Technologies, Inc. (the acronym for "Semiconductor Test Architects"), a leading supplier in integrated test systems, WAT/Wafer sort probe cards, and ATE for the semiconductor...