STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high speed and precision test requirement that is applicable for highly parallel large array multi-DUT Memory devices to increase productivity with reduced cost-of-test. Aries-Prima at its extreme, is used for "one-touch" Memory IC tests, at which only one touch-down contact is required for testing the whole 300mm wafer.
Driven by the market uptrend for AI, AR, VR, and cloud services which drive IT infrastructure and the explosive growth of computing memory and power. With such increasing demands, our industry customers need to increase wafer-level test efficiency with the lowest possible probe card cost, which is one of the highest test consumable expenditures. To meet these requirements, STAr has been developing MEMS probe technologies for years and launched the high-value MEMS probe cards to the test market this year.
The Aries-Prima series MEMS probe card is designed for interfacing both DRAM and FLASH Memory ICs wafers to ATE for large array multi-DUT tests. Aries-Prima enables wide temperature range, from
-40degC to 150degC, wafer-level tests with "one-touch" capabilities for 300mm wafers. This is achieved with stable probe contact up to 120um over-drive from first contact and coefficient of thermal expansion (CTE) equivalent to that of silicon wafers.
In addition, STAr enhances the physical characteristics of 3D MEMS probes for extended probe contact lifetimes. With a maximum of 100,000 pins, up to 1536 DUTs in parallel, and minimum pitch down to 50um, Aries-Prima provides reliable measurement data with testing speed up to 3.2Gbps for leading Memory ICs.
"STAr is devoted to MEMS probe technology development and is eager to bring customers great test experiences for now and in the future. Aries-Prima is another achievement for one-touch memory test probe card technology. We believe the revolutionary structure and probe properties will dramatically improve capability achieving lower cost-of-tests," said Dr. Choon-Leong Lou, CEO & CTO of STAr Technologies.
STAr Aries-Prima one-touch memory test probe card
Photo: Company