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KLA-Tencor announces new inspection portfolio for 3X/2Xnm nodes

Press release

Jul 14, 2009, 14:30 0

KLA-Tencor has announced two new wafer inspection systems and a new electron-beam (e-beam) review system to address defect issues at the 3Xnm / 2Xnm nodes...

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EDOM Accelerates Edge AI Deployment with NVIDIA Technologies

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