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Next-generation EDA for deep sub-micron: Q&A with Cy Hay, Synopsys Inc., part three

Chris Hall, DigiTimes.com, Taipei Friday 18 March 2005 0

On the occasion of a recent visit to Taipei, DigiTimes.com had the opportunity to talk with Cy Hay, marketing manager, Test Automation Products, Synopsys Inc. Hay emphasized the need for test compression for deep sub-micron designs, now enabled by the...

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