China has taken a major step toward localising advanced semiconductor materials. The Standardisation Administration of China has released the national standard "Test Methods for EUV Photoresists" for a month of public consultation. Jointly drafted by Shanghai University, Zhangjiang Laboratory, Shanghai Huali Microelectronics Corp. (HLMC), and Shanghai Micro Electronics Equipment (SMEE) with other major research institutes and manufacturers, this marks China's first national-level standard dedicated to EUV photoresists